Yield Management

MK Unisoft has experience in providing a variety of easy-to-use tools to identify, classify, analyze and understand process defects.

Fabwide Defect Management � Seamless integration of yield and defect management software.
Yield Optimization � Correlate in-line data to EOL Results.

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Services Offered

Semiconductor Technology
Information Technology

Semiconductor Technology

Automated Wafer Inspection
Integrated Wafer Inspection
Automated Wafer Metrology
Yield Management
Equipment Automation
Automation Testing
MES Integration

Equipment Automation

SEMI Standards Support
Automation Software
E-84 Compliance Testing
FAB Experience
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2020-09-23 - Wed